toggle visibility
Search within Results:
Display Options:

Select All    Deselect All
List View
 |   | 
   print
  Author Title Year (down) Publication Volume Times cited Additional Links Links
Schowalter, M.; Rosenauer, A.; Lamoen, D.; Kruse, P.; Gerthsen, D. Ab initio computation of the mean inner Coulomb potential of wurtzite-type semiconductors and gold 2006 Applied Physics Letters 88 8 UA library record; WoS full record; WoS citing articles doi
Kruse, P.; Schowalter, M.; Lamoen, D.; Rosenauer, A.; Gerthsen, D. Determination of the mean inner potential in III-V semiconductors, Si and Ge by density functional theory and electron holography 2006 Ultramicroscopy 106 50 UA library record; WoS full record; WoS citing articles doi
Müller, E.; Kruse, P.; Gerthsen, D.; Schowalter, M.; Rosenauer, A.; Lamoen, D.; Kling, R.; Waag, A. Measurement of the mean inner potential of ZnO nanorods by transmission electron holography 2005 Applied Physics Letters 86 5 UA library record; WoS full record; WoS citing articles doi
Schowalter, M.; Titantah, J.T.; Lamoen, D.; Kruse, P. Ab initio computation of the mean inner Coulomb potential of amorphous carbon structures 2005 Applied physics letters 86 15 UA library record; WoS full record; WoS citing articles doi
Müller, E.; Kruse, P.; Gerthsen, D.; Schowalter, M.; Rosenauer, A.; Lamoen, D.; Kling, R. Measurement of the mean inner potential of ZnO nanorods by transmission electron holography 2005 Microscopy of Semiconducting Materials 107 UA library record; WoS full record; pdf
Schowalter, M.; Rosenauer, A.; Lamoen, D.; Kruse, P.; Gerthsen, D. Ab initio computation of the mean inner Coulomb potential of technological important semiconductors 2005 1007 UA library record; WoS full record;
Schowalter, M.; Lamoen, D.; Kruse, P.; Gerthsen, D.; Rosenauer, A. First-principles calculations of the mean inner Coulomb potential for sphalerite type II.VI semiconductors 2004 Applied Physics Letters 85 16 UA library record; WoS full record; WoS citing articles doi
Select All    Deselect All
List View
 |   | 
   print

Save Citations:
Export Records: