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  Author Title Year (down) Publication Volume Times cited Additional Links Links
de Gendt, S.; Kenis, K.; Mertens, P.W.; Heyns, M.M.; Claes, M.; Van Grieken, R.E.; Bailleul, A.; Knotter, M.; de Bokx, P.K. Use of grazing emission XRF spectrometry for silicon wafer surface contamination measurements 1996 UA library record
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