toggle visibility
Search within Results:
Display Options:

Select All    Deselect All
List View
 |   | 
   print
  Author Title Year (down) Publication Volume Times cited Additional Links Links
Jalabert, D.; Pelloux-Gervais, D.; Béché, A.; Hartmann, J.M.; Gergaud, P.; Rouvière, J.L.; Canut, B. Depth strain profile with sub-nm resolution in a thin silicon film using medium energy ion scattering 2012 Physica Status Solidi A-Applications And Materials Science 209 3 UA library record; WoS full record; WoS citing articles doi
Select All    Deselect All
List View
 |   | 
   print

Save Citations:
Export Records: