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  Author Title Year (down) Publication Volume Times cited Additional Links Links
Poulain, R.; Lumbeeck, G.; Hunka, J.; Proost, J.; Savolainen, H.; Idrissi, H.; Schryvers, D.; Gauquelin, N.; Klein, A. Electronic and chemical properties of nickel oxide thin films and the intrinsic defects compensation mechanism 2022 ACS applied electronic materials 4 UA library record; WoS full record; WoS citing articles pdf doi
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