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  Author Title Year (down) Publication Volume Times cited Additional Links Links
Bittencourt, C.; Hitchock, A.P.; Ke, X.; Van Tendeloo, G.; Ewels, C.P.; Guttmann, P. X-ray absorption spectroscopy by full-field X-ray microscopy of a thin graphite flake: Imaging and electronic structure via the carbon K-edge 2012 Beilstein journal of nanotechnology 3 15 UA library record; WoS full record; WoS citing articles pdf url doi
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