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  Author Title Year (down) Publication Volume Times cited Additional Links Links
Felten, A.; Gillon, X.; Gulas, M.; Pireaux, J.-J.; Ke, X.; Van Tendeloo, G.; Bittencourt, C.; Najafi, E.; Hitchcock, A.P. Measuring point defect density in individual carbon nanotubes using polarization-dependent X-ray microscopy 2010 ACS nano 4 26 UA library record; WoS full record; WoS citing articles pdf doi
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