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Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
Oleshko, V.P.; Gijbels, R.H.; Jacob, W.A. |
Analytical electron microscopy of silver halide photographic systems |
2000 |
Micron |
31 |
8 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Oleshko, V.P.; Gijbels, R.H.; Bilous, V.M.; Jacob, W.A.; Alfimov, M.V. |
Evolution of impurity clusters and photographic sensitivity |
2000 |
Zhurnal nauchnoj prikladnoj fotografii i kinematografii |
45 |
|
UA library record |
|
|
|
Oleshko, V.P.; Gijbels, R.H.; van Daele, A.J.; Jacob, W.A. |
On estimation of the dielectric function of Ag(Br,I) nanocrystals by cryo-EELS (addendum) |
1999 |
Nanostructered materials |
11 |
|
UA library record |
|
|
|
Oleshko, V.P.; Gijbels, R.H.; van Daele, A.J.; Jacob, W.A.; Xu, Y.-E.; Wang, S.-E.; Park, I.-Y.; Kang, T.-S. |
Combined characterization of composite tabular silver halide microcrystals by cryo-EFTEM/EELS and cryo-STEM/EDX techniques |
1998 |
Microscopy research and technique |
42 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Gregory, C.L.; Nullens, H.A.; Gijbels, R.H.; van Espen, P.J.; Geuens, I.; de Keyzer, R. |
Automated particle analysis of populations of silver halide microcrystals by electron probe microanalysis under cryogenic conditions |
1998 |
Analytical chemistry |
70 |
12 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Oleshko, V.P.; van Daele, A.; Gijbels, R.H.; Jacob, W.A. |
Structural and analytical characterization of Ag(Br,I) nanocrystals by cryo-AEM techniques |
1998 |
Journal of nanostructured materials |
10 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Oleshko, V.P.; van Daele, A.J.; Gijbels, R.H.; Jacob, W.A. |
Study of electron excitations in Ag(Br,I) nanocrystals by cryo-AEM techniques |
1998 |
|
|
|
UA library record; WoS full record; |
|
|
|
Oleshko, V.P.; Gijbels, R.H.; Jacob, W.A.; van Daele, A.J. |
Structural and analytical characterization of composite tabular silver halide microcrystals by cryo-EFTEM/EELS and cryo-STEM/EDX techniques |
1998 |
|
|
|
UA library record |
|
|
|
Oleshko, V.P.; Gijbels, R.H.; Jacob, W.A. |
Reduction of composite Ag(Br,I) grains as studied by AEM and digital image analysis techniques |
1998 |
|
|
|
UA library record; WoS full record; |
|
|
|
Oleshko, V.P.; Gijbels, R.H.; Bilous, V.M.; Jacob, W.A.; Alfimov, M.V. |
Evolution of impurity clusters and mechanism of formation of photographic sensitivity |
1998 |
|
|
|
UA library record |
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