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  Author Title Year (down) Publication Volume Times cited Additional Links Links
Alfeld, M.; Vekemans, B.; Janssens, K.; Falkenberg, G.; Broekaert, J.A.C.; Gao, N.; Gibson, D. Depth profiling of multilayered systems by means of confocal μ-XRF in the laboratory an at HASYLAB BL L: a comparison 2007 UA library record
Bichlmeier, S.; Janssens, K.; Heckel, J.; Gibson, D.; Hoffmann, P.; Ortner, H.M. Component selection for a compact micro-XRF spectrometer 2001 X-ray spectrometry 30 33 UA library record; WoS full record; WoS citing articles doi
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