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Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Idrissi, H.; Kobler, A.; Amin-Ahmadi, B.; Coulombier, M.; Galceran, M.; Raskin, J.-P.; Godet, S.; Kuebel, C.; Pardoen, T.; Schryvers, D. |
Plasticity mechanisms in ultrafine grained freestanding aluminum thin films revealed by in-situ transmission electron microscopy nanomechanical testing |
2014 |
Applied physics letters |
104 |
24 |
UA library record; WoS full record; WoS citing articles |
|
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Amin-Ahmadi, B.; Idrissi, H.; Galceran, M.; Colla, M.S.; Raskin, J.P.; Pardoen, T.; Godet, S.; Schryvers, D. |
Effect of deposition rate on the microstructure of electron beam evaporated nanocrystalline palladium thin films |
2013 |
Thin solid films : an international journal on the science and technology of thin and thick films |
539 |
13 |
UA library record; WoS full record; WoS citing articles |
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Wang, B.; Idrissi, H.; Galceran, M.; Colla, M.S.; Turner, S.; Hui, S.; Raskin, J.P.; Pardoen, T.; Godet, S.; Schryvers, D. |
Advanced TEM investigation of the plasticity mechanisms in nanocrystalline freestanding palladium films with nanoscale twins |
2012 |
International journal of plasticity |
37 |
44 |
UA library record; WoS full record; WoS citing articles |
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