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Kavak, S.; Jannis, D.; De Backer, A.; Esteban, D.A.; Annys, A.; Carrasco, S.; Ferrando-Ferrero, J.; Guerrero, R.M.; Horcajada, P.; Verbeeck, J.; Van Aert, S.; Bals, S. High-resolution electron microscopy imaging of MOFs at optimized electron dose 2025 Journal of Materials Chemistry A url doi
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