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	Author	Title	Year	Publication	Volume	Times cited	Additional Links	Links
	de Witte, H.; de Gendt, S.; Douglas, M.; Conard, T.; Kenis, K.; Mertens, P.W.; Vandervorst, W.; Gijbels, R.	Evaluation of time-of-flight secondary ion mass spectrometry for metal contamination monitoring on wafer surfaces	2000	Journal of the electrochemical society	147	14	UA library record; WoS full record; WoS citing articles
	de Witte, H.; de Gendt, S.; Douglas, M.; Conard, T.; Kenis, K.; Mertens, P.W.; Vandervorst, W.; Gijbels, R.	Capabilities of TOF-SIMS to study the influence of different oxidation conditions on metal contamination redistribution	1999				UA library record; WoS full record;

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