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Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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|
Do, M.T.; Gauquelin, N.; Nguyen, M.D.; Blom, F.; Verbeeck, J.; Koster, G.; Houwman, E.P.; Rijnders, G. |
Interface degradation and field screening mechanism behind bipolar-cycling fatigue in ferroelectric capacitors |
2021 |
Apl Materials |
9 |
5 |
UA library record; WoS full record; WoS citing articles |
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Do, M.T.; Gauquelin, N.; Nguyen, M.D.; Wang, J.; Verbeeck, J.; Blom, F.; Koster, G.; Houwman, E.P.; Rijnders, G. |
Interfacial dielectric layer as an origin of polarization fatigue in ferroelectric capacitors |
2020 |
Scientific Reports |
10 |
18 |
UA library record; WoS full record; WoS citing articles |
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|
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Wang, J.; Nguyen, M.D.; Gauquelin, N.; Verbeeck, J.; Do, M.T.; Koster, G.; Rijnders, G.; Houwman, E. |
On the importance of the work function and electron carrier density of oxide electrodes for the functional properties of ferroelectric capacitors |
2020 |
Physica Status Solidi-Rapid Research Letters |
14 |
6 |
UA library record; WoS full record; WoS citing articles |
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