| |
Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
Gholam, S.; Denisov, N.; Orekhov, A.; Verbeeck, J.; Hadermann, J. |
An Investigation on 3D Electron Diffraction and 4-Dimensional Scanning Diffraction Tomography Using a Scanning Electron Microscope |
2024 |
Microscopy and Microanalysis |
30 |
|
|
|
|
|
Denisov, N.; Jannis, D.; Orekhov, A.; Müller-Caspary, K.; Verbeeck, J. |
Characterization of a Timepix detector for use in SEM acceleration voltage range |
2023 |
Ultramicroscopy |
253 |
|
UA library record; WoS full record |
|
|
|
Vlasov, E.; Denisov, N.; Verbeeck, J. |
Low-cost electron detector for scanning electron microscope |
2023 |
HardwareX |
14 |
1 |
UA library record; WoS full record; WoS citing articles |
|
