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	Author	Title	Year	Publication	Volume	Times cited	Additional Links	Links
	Lumbeeck, G.; Delvaux, A.; Idrissi, H.; Proost, J.; Schryvers, D.	Analysis of internal stress build-up during deposition of nanocrystalline Ni thin films using transmission electron microscopy	2020	Thin solid films : an international journal on the science and technology of thin and thick films	707		UA library record; WoS full record; WoS citing articles
	Delvaux, A.; Lumbeeck, G.; Idrissi, H.; Proost, J.	Effect of microstructure and internal stress on hydrogen absorption into Ni thin film electrodes during alkaline water electrolysis	2020	Electrochimica Acta	340	2	UA library record; WoS full record; WoS citing articles

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