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Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
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Nistor, L.; Buschmann, V.; Ralchenko, V.; Dinca, G.; Vlasov, I.; van Landuyt, J.; Fuess, H. |
Microstructural characterization of diamond films deposited on c-BN crystals |
2000 |
Diamond and related materials
T2 – 10th European Conference on Diamond, Diamond-Like Materials, Nitrides, and Silicon Carbide (Diamond 1999), SEP 12-17, 1999, PRAGUE, CZECH REPUBLIC |
9 |
9 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Buschmann, V.; Rodewald, M.; Fuess, H.; Van Tendeloo, G.; Schäffer, C. |
High resolution electron microscopy study of molecular beam epitaxy grown CoSi2/Si1-xGex/Si(100) heterostructurs |
1999 |
Journal of applied physics |
85 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
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Buschmann, V.; Van Tendeloo, G. |
Structural characterization of colloidal Ag2Se nanocrystals |
1998 |
Langmuir |
14 |
15 |
UA library record; WoS full record; WoS citing articles |
|
|
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Buschmann, V.; Fedina, L.; Rodewald, M.; Van Tendeloo, G. |
A new model for the (2x1) reconstructed CoSi2-Si(100) interface |
1998 |
Philosophical magazine letters |
77 |
10 |
UA library record; WoS full record; WoS citing articles |
|
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Buschmann, V.; Rodewald, M.; Fuess, H.; Van Tendeloo, G.; Schaffer, C. |
Hetero-epitaxial growth of CoSi2 thin films on Si(100) : template effects and epitaxial orientations |
1998 |
Journal of crystal growth |
191 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
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Buschmann, V.; Schryvers, D.; van Landuyt, J.; van Roost, C.; de Keyzer, R. |
A comparative investigation of replication techniques used for the study of (S+Au) sensitized AgBr microcrystals |
1996 |
The journal of imaging science and technology |
40 |
4 |
UA library record; WoS full record; WoS citing articles |
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Buschmann, V.; Schryvers, D.; van Landuyt, J.; van Roost, C. |
EM study of sensitisation of silver halide grains |
1994 |
Icem |
13 |
|
UA library record; WoS full record; |
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