|
Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
Alfeld, M.; Broekaert, J.A.C. |
Mobile depth profiling and sub-surface imaging techniques for historical paintings : a review |
2013 |
Spectrochimica acta: part B : atomic spectroscopy |
88 |
|
UA library record; WoS full record; WoS citing articles |
|
|
Bings, N.H.; Bogaerts, A.; Broekaert, J.A.C. |
Atomic spectroscopy |
2013 |
Analytical chemistry |
85 |
29 |
UA library record; WoS full record; WoS citing articles |
|
|
Bings, N.H.; Bogaerts, A.; Broekaert, J.A.C. |
Atomic spectroscopy: a review |
2010 |
Analytical chemistry |
82 |
65 |
UA library record; WoS full record; WoS citing articles |
|
|
Bings, N.H.; Bogaerts, A.; Broekaert, J.A.C. |
Atomic spectroscopy |
2008 |
Analytical chemistry |
80 |
53 |
UA library record; WoS full record; WoS citing articles |
|
|
Alfeld, M.; Vekemans, B.; Janssens, K.; Falkenberg, G.; Broekaert, J.A.C.; Gao, N.; Gibson, D. |
Depth profiling of multilayered systems by means of confocal μ-XRF in the laboratory an at HASYLAB BL L: a comparison |
2007 |
|
|
|
UA library record |
|
|
Bings, N.H.; Bogaerts, A.; Broekaert, J.A.C. |
Atomic spectroscopy |
2006 |
Analytical chemistry |
78 |
112 |
UA library record; WoS full record; WoS citing articles |
|
|
Bings, N.H.; Bogaerts, A.; Broekaert, J.A.C. |
Atomic spectroscopy |
2004 |
Analytical chemistry |
76 |
32 |
UA library record; WoS full record; WoS citing articles |
|
|
Bings, N.H.; Bogaerts, A.; Broekaert, J.A.C. |
Atomic spectroscopy |
2002 |
Analytical chemistry |
74 |
18 |
UA library record; WoS full record; WoS citing articles |
|
|
Held, A.; Taylor, P.; Ingelbrecht, C.; de Bièvre, P.; Broekaert, J.; van Straaten, M.; Gijbels, R. |
Determination of scandium in high-purity titanium using inductively coupled plasma mass spectrometry and glow discharge mass spectrometry as part of its certification as a reference material |
1995 |
Journal of analytical atomic spectrometry |
10 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
Xhoffer, C.; Jacob, W.; Van Grieken, R.; Broekaert, J.A.C.; Buseck, P. |
Electron energy-loss spectroscopy and its application to individual particle analysis |
1992 |
|
|
|
UA library record |
|