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Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
Do, M.T.; Gauquelin, N.; Nguyen, M.D.; Blom, F.; Verbeeck, J.; Koster, G.; Houwman, E.P.; Rijnders, G. |
Interface degradation and field screening mechanism behind bipolar-cycling fatigue in ferroelectric capacitors |
2021 |
Apl Materials |
9 |
5 |
UA library record; WoS full record; WoS citing articles |
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Do, M.T.; Gauquelin, N.; Nguyen, M.D.; Wang, J.; Verbeeck, J.; Blom, F.; Koster, G.; Houwman, E.P.; Rijnders, G. |
Interfacial dielectric layer as an origin of polarization fatigue in ferroelectric capacitors |
2020 |
Scientific Reports |
10 |
18 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Valkering, A.M.C.; Sommerfeld, P.K.H.; van de Ven, R.A.M.; van der Heijden, R.W.; Blom, F.A.P.; Lea, M.J.; Peeters, F.M. |
Hall magnetocapitance in two-dimensional electron systems |
1998 |
Physical review letters |
81 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
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Blom, F.A.P.; Peeters, F.M.; van de Zanden, K.; van Hove, M. |
Magneto-oscillations of the gate current in a laterally modulated two-dimensional electron gas |
1996 |
Surface science : a journal devoted to the physics and chemistry of interfaces |
361/362 |
1 |
UA library record; WoS full record; WoS citing articles |
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