Nano Home

NANOlab Center of Excellence literature database

Home |  Show All |  Simple Search |  Advanced Search
Quick Search:
1–1 of 1 record found matching your query (RSS):
toggle visibility
Search within Results:
Display Options:
Select All    Deselect All << 1 >>
List View
 | 
Citations
 | 
Details
   print
  Author Title Year (down) Publication Volume Times cited Additional Links Links
Cooper, D.; Denneulin, T.; Bernier, N.; Béché, A.; Rouvière, J.-L. Strain mapping of semiconductor specimens with nm-scale resolution in a transmission electron microscope 2016 Micron 80 50 UA library record; WoS full record; WoS citing articles url doi
Select All    Deselect All << 1 >>
List View
 | 
Citations
 | 
Details
   print
toggle visibility
Save Citations:
Export Records:
Home CQL Search  |  Library Search  |  Show Record  |  Extract Citations Help