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  Author Title Year (down) Publication Volume Times cited Additional Links Links
Verlinden, G.; Gijbels, R.; Geuens, I.; Benninghoven, A. Imaging time-of-flight SIMS (TOF-SIMS) surface analysis of halide distributions in complex silver halide microcrystals 1998 UA library record
Verlinden, G.; Gijbels, R.; Brox, O.; Benninghoven, A.; Geuens, I.; de Keyzer, R. Surface analysis of silver halide microcrystals by imaging time-of-flight SIMS (TOF-SIMS) 1997 UA library record; WoS full record;
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