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Author Title Year (down) Publication Volume Times cited Additional Links
Chen, B.; Gauquelin, N.; Jannis, D.; Cunha, D.M.; Halisdemir, U.; Piamonteze, C.; Lee, J.H.; Belhadi, J.; Eltes, F.; Abel, S.; Jovanovic, Z.; Spreitzer, M.; Fompeyrine, J.; Verbeeck, J.; Bibes, M.; Huijben, M.; Rijnders, G.; Koster, G. Strain-engineered metal-to-insulator transition and orbital polarization in nickelate superlattices integrated on silicon 2020 Advanced Materials 18 UA library record; WoS full record; WoS citing articles
Jannis, D.; Müller-Caspary, K.; Béché, A.; Oelsner, A.; Verbeeck, J. Spectroscopic coincidence experiments in transmission electron microscopy 2019 Applied physics letters 114 18 UA library record; WoS full record; WoS citing articles
Wang, J.; Shin, Y.; Gauquelin, N.; Yang, Y.; Lee, C.; Jannis, D.; Verbeeck, J.; Rondinelli, J.M.; May, S.J. Physical properties of epitaxial SrMnO2.5−δFγoxyfluoride films 2019 Journal of physics : condensed matter 31 5 UA library record; WoS full record; WoS citing articles
Prabhakara, V.; Jannis, D.; Béché, A.; Bender, H.; Verbeeck, J. Strain measurement in semiconductor FinFET devices using a novel moiré demodulation technique 2019 Semiconductor science and technology 8 UA library record; WoS full record; WoS citing articles
Jannis, D.; Müller-Caspary, K.; Béché, A.; Oelsner, A.; Verbeeck, J. Spectrocopic coincidence experiment in transmission electron microscopy 2019 UA library record