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Year
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Buschmann, V.
;
Rodewald, M.
;
Fuess, H.
;
Van Tendeloo, G.
;
Schäffer, C.
High resolution electron microscopy study of molecular beam epitaxy grown CoSi2/Si1-xGex/Si(100) heterostructurs
1999
Journal of applied physics
85
6
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