|
“Multiply twinned phases and microstructures in Ni-Al: a transmission electron microscopy study”. Schryvers D s.l., page 143 (1991).
Keywords: H3 Book chapter; Electron microscopy for materials research (EMAT)
|
|
|
“Nanodesign of combined micro- and mesoporous materials for specific applications in adsorption and catalysis”. Meynen V, Busuioc AM, Beyers E, Cool P, Vansant EF, Bilba N, Mertens M, Lebedev O, Van Tendeloo G Nova, New York (2007).
Keywords: H3 Book chapter; Electron microscopy for materials research (EMAT); Laboratory of adsorption and catalysis (LADCA)
|
|
|
“Nanoparticles in glass and glazes”. Frederickx P, De Vis K, Wouters H, Helary D, Schryvers D, (2005)
Keywords: P3 Proceeding; Art; Electron microscopy for materials research (EMAT)
|
|
|
Batuk M (2013) New perovskite-based homologous series : AnBnO3n-2 and An+1BnO3n-1Cl. Antwerpen
Keywords: Doctoral thesis; Electron microscopy for materials research (EMAT)
|
|
|
“The notion of resolution”. Van Aert S, den Dekker AJ, van Dyck D, van den Bos A Springer, Berlin, page 1228 (2008).
Keywords: H3 Book chapter; Electron microscopy for materials research (EMAT); Vision lab
|
|
|
“The notion of resolution”. Van Aert S, den Dekker AJ, van Dyck D, van den Bos A Springer, Berlin, page 1228 (2007).
Keywords: H3 Book chapter; Electron microscopy for materials research (EMAT); Vision lab
|
|
|
“Nucleation and growth of the Ni5Al3 in NiAl austenite and martensite”. Schryvers D, Toth L, Ma Y, Tanner LE, Journal de physique: 4 C2, 299 (1994)
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
|
|
|
“The “oblique&rdquo, zone imaging of the superlattice in complex crystal structure”. Milat O, Krekels T, Van Tendeloo G, Amelinckx S, Icem 13, 859 (1994)
Keywords: A3 Journal article; Electron microscopy for materials research (EMAT)
|
|
|
“Obstacles on the road towards atomic resolution tomography”. van Dyck D, Van Aert S, Croitoru MD, Microscoy and microanalysis 11, 238 (2005)
Keywords: A3 Journal article; Electron microscopy for materials research (EMAT); Condensed Matter Theory (CMT); Vision lab
|
|
|
“Oxide superconductors: electron microscopy”. Mitchell TE, Gronsky R, Van Tendeloo G Pergamon Press, Oxford, page 401 (1992).
Keywords: H3 Book chapter; Electron microscopy for materials research (EMAT)
|
|
|
“Oxygen ordering and critical temperature plateaus in ABa2Cu3O7-d (A=Er, Nd, Sm, Yb), pp”. Zou H, Krekels T, Van Tendeloo G, Wagener G, Buchgeister M, Hosseini SM, Kopitzki K, , 278 (1992)
Keywords: P3 Proceeding; Electron microscopy for materials research (EMAT)
|
|
|
“Phase boundaries of superconducting mesoscopic square loops”. Fomin VM, Misko VR, Devreese JT, Moshchalkov VV, 12th International Conference on the Electronic Properties of Two-Dimensional Systems (EP2DS), Tokyo, 835 (1997)
Keywords: A1 Journal article; Electron Microscopy for Materials Science (EMAT);
|
|
|
Tavernier S, op de Beeck W, Ghekiere J-P, Van Tendeloo G (1996) Positively charged toner for use in electrostatography : US5532097 : 07/02/1996
Keywords: Patent; Electron microscopy for materials research (EMAT)
|
|
|
“Precipitation behavior in Cu-Co alloy”. Takeda M, Shinohara G, Yamada H, Yoshida S, van Landuyt J, Hashimoto H, , 205 (1998)
Keywords: P3 Proceeding; Electron microscopy for materials research (EMAT)
|
|
|
“Probing local stoichiometry in InGaN based quantum wells of solid-state LEDs”. Jinschek JR, Bals S, Gopal V, Xus X, Kisielowski C, Microscopy and microanalysis 10, 294 (2004). http://doi.org/10.1017/S1431927604882813
Keywords: A3 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.891
DOI: 10.1017/S1431927604882813
|
|
|
Cao S (2010) Quantitative 3D analysis of Ni4Ti3 precipitate morphology and distribution in Ni-Ti by FIB/SEM slice-and-view. Antwerpen
Keywords: Doctoral thesis; Electron microscopy for materials research (EMAT)
|
|
|
Wang W-C (2011) Quantitative analysis of electron exit waves with single atom sensitivity. Antwerpen
Keywords: Doctoral thesis; Electron microscopy for materials research (EMAT)
|
|
|
de Backer A (2015) Quantitative atomic resolution electron microscopy using advanced statistical techniques. Antwerpen
Keywords: Doctoral thesis; Electron microscopy for materials research (EMAT)
|
|
|
Heidari Mezerji H (2012) Quantitative electron tomography of nanoparticles. Antwerpen
Keywords: Doctoral thesis; Electron microscopy for materials research (EMAT)
|
|
|
Martí,nez Alanis GT (2015) Quantitative model-based high angle annular dark field scanning transmission electron microscopy. Antwerpen
Keywords: Doctoral thesis; Electron microscopy for materials research (EMAT); Engineering Management (ENM)
|
|
|
“Recent results on characterization of detonation nanodiamonds”. Vlasov II, Turner S, Van Tendeloo G, Shiryaev AA Elsevier, Amsterdam, page 291 (2012).
Keywords: H3 Book chapter; Electron microscopy for materials research (EMAT)
|
|
|
“Refinement of chemically sensitive structure factors using parallel and convergent beam electron nanodiffraction”. Müller K, Schowalter M, Rosenauer A, Jansen J, Tsuda K, Titantah JT, Lamoen D, Journal of physics : conference series 209, 012025 (2010). http://doi.org/10.1088/1742-6596/209/1/012025
Abstract: We introduce a new method to measure structure factors from parallel beam electron diffraction (PBED) patterns. Bloch wave refinement routines were developed which can minimise the difference between simulated and experimental Bragg intensities via variation of structure factors, Debye parameters, specimen thickness and -orientation. Due to plane wave illumination, the PBED refinement is highly efficient not only in computational respect, but also concerning the experimental effort since energy filtering is shown to have no significant effect on the refinement results. The PBED method was applied to simulated GaAs diffraction patterns to derive systematic errors and rules for the identification of plausible refinement results. The evaluation of experimental GaAs PBED patterns yields a 200 X-ray structure factor of -6.33±0.14. Additionally, we obtained -6.35±0.13 from two-dimensional convergent beam electron diffraction refinements. Both results confirm density functional theory calculations published by Rosenauer et al. and indicate the inaccuracy of isolated atom scattering data, which is crucial e.g. for the composition evaluation by lattice fringe analysis.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
DOI: 10.1088/1742-6596/209/1/012025
|
|
|
“Reliable pore-size measurements based on a procedure specifically designed for electron tomography measurements of nanoporous samples”. Van Eyndhoven G, Batenburg KJ, van Oers C, Kurttepeli M, Bals S, Cool P, Sijbers J, (2014)
Keywords: P3 Proceeding; Electron microscopy for materials research (EMAT); Vision lab; Laboratory of adsorption and catalysis (LADCA)
|
|
|
“The selective imaging of “substructures&rdquo, in the mixed layer compounds Ca0.85CuO2 and (Ca,Sr)14Cu24O41”. Amelinckx S, Milat O, Van Tendeloo G, , 240 (1992)
Keywords: P3 Proceeding; Electron microscopy for materials research (EMAT)
|
|
|
“Statistical parameter estimation theory : a tool for quantitative electron microscopy”. Van Aert S Wiley-VCH, Weinheim, page 281 (2012).
Keywords: H1 Book chapter; Electron microscopy for materials research (EMAT)
|
|
|
Egoavil R (2014) STEM investigation of complex oxides at the atomic scale. Antwerpen
Keywords: Doctoral thesis; Electron microscopy for materials research (EMAT)
|
|
|
“Strained La1-xSrxMnO3 (x = 0.1 – 0.3) thin films studied by HREM”. Lebedev OI, Van Tendeloo G, Amelinckx S s.l., page 201 (2000).
Keywords: H3 Book chapter; Electron microscopy for materials research (EMAT)
|
|
|
“Structural aspects of carbon nanotubes”. Bernaerts D, Amelinckx S, Zhang XB, Van Tendeloo G, van Landuyt J, , 551 (1995)
Keywords: P3 Proceeding; Electron microscopy for materials research (EMAT)
|
|
|
“Structural changes in fluorinated T{'} and T* phases”. Hadermann J, Abakumov AM, Lebedev OI, Antipov EV, Van Tendeloo G, , 193 (2000)
Keywords: P3 Proceeding; Electron microscopy for materials research (EMAT)
|
|
|
“Structural, chemical and electronic characterization of ceramic materials using quantitative (scanning) transmission electron microscopy”. Bals S, Van Aert S, Verbeeck J, Van Tendeloo G, Microscopy and microanalysis 13, 332 (2007). http://doi.org/10.1017/S1431927607081664
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.891
DOI: 10.1017/S1431927607081664
|
|