Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Komendová, L. |
Characteristic length scales and vortex interactions in two-component superconducting systems |
2013 |
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|
|
UA library record |
Yasuda, K.; Hisatsune, K.; Udoh, K.; Tanaka, Y.; Van Tendeloo, G.; van Landuyt, J. |
Characteristic mosaic texture related to orderingin AuCu-9at.%Ag pseudobinary alloy |
1992 |
Dentistry in Japan |
29 |
|
UA library record |
Austing, D.G.; Payette, C.; Yu, G.; Gupta, J.A.; Aers, G.C.; Nair, S.V.; Partoens, B.; Amaha, S.; Tarucha, S. |
Characterization and modeling of single-particle energy levels and resonant currents in a coherent quantum dot mixer |
2011 |
AIP conference proceedings
T2 – 30th International Conference on the Physics of Semiconductors (ICPS-30), JUL 25-30, 2010, Seoul, SOUTH KOREA |
|
|
UA library record; WoS full record |
d' Hondt, H. |
Characterization of anion deficient perovskites |
2011 |
|
|
|
UA library record |
Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. |
Characterization of complex silver halide photographic systems by means of analytical electron microscopy |
1994 |
Microbeam analysis |
3 |
|
UA library record |
Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
Characterization of crystal defects and analysis of iodide distribution in mixed tabular silver halide grains by conventional transmission electron microscopy, X-ray diffractometry and back-scattered electron imaging |
1991 |
|
|
|
UA library record |
Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Verbeeck, A.; de Keyzer, R. |
Characterization of crystal defects in mixed tabular silver halide grains by conventional transmission electron microscopy and X-ray diffractometry |
1991 |
Journal of crystal growth |
110 |
40 |
UA library record; WoS full record; WoS citing articles |
Kirilenko, D. |
Characterization of graphene by electron diffraction |
2012 |
|
|
|
UA library record |
Volkov, V.V.; van Landuyt, J.; Marushkin, K.M.; Gijbels, R.; Férauge, C.; Vasilyev, M.G.; Shelyakin, A.A.; Sokolovsky, A.A. |
Characterization of LPE grown InGaAsP/InP heterostructures: IR-LED at 1.66 μm used for the remote monitoring of methane gas |
1997 |
Journal of crystal growth |
173 |
4 |
UA library record; WoS full record; WoS citing articles |
Wiktor, C. |
Characterization of metal-organic frameworks and other porous materials via advanced transmission electron microscopy |
2014 |
|
|
|
UA library record |
Ahonen, P.P.; Kauppinen, E.I.; Tapper, U.; Nenonen, P.; Joubert, J.C.; Deschanvres, J.L.; Van Tendeloo, G. |
Characterization of MO derived nanostructured titania powders |
1998 |
Electron microscopy: vol. 2 |
|
|
UA library record; WoS full record; |
van Cleempoel, A.; Gijbels, R.; Claeys, M.; van den Heuvel, H. |
Characterization of ozonated C60 and C70 by high performance liquid chromatography and low- and high-energy collision-induced dissociation tandem mass spectrometry |
1996 |
Rapid communications in mass spectrometry |
10 |
10 |
UA library record; WoS full record; WoS citing articles |
Colomer, J.-F.; Benoit, J.-M.; Stephan, C.; Lefrant, S.; Van Tendeloo, G.; Nagy, J.B. |
Characterization of single-wall carbon nanotubes produced by CCVD method |
2001 |
Chemical physics letters |
345 |
45 |
UA library record; WoS full record; WoS citing articles |
Leroux, F. |
Characterization of soft-hard matter composite materials by advanced transmission electron microscopy |
2012 |
|
|
|
UA library record |
de Vyt, A.; Gijbels, R.; Davock, H.; van Roost, C.; Geuens, I. |
Characterization of AgxAuy nano particles by TEM and STEM |
1999 |
Journal of analytical atomic spectrometry |
14 |
2 |
UA library record; WoS full record; WoS citing articles |
van Landuyt, J.; Van Tendeloo, G. |
Charcaterization by high-resolution transmission electron microscopy |
1998 |
|
|
|
UA library record; WoS full record; |
Hervieu, M.; Martin, C.; Van Tendeloo, G.; Mercey, B.; Maignan, A.; Jirak, Z.; Raveau, B. |
Charge ordering and phase transitions in perovskite manganites: correlation with CMR properties |
2000 |
|
|
|
UA library record |
Hervieu, M.; Martin, C.; Maignan, A.; Van Tendeloo, G.; Raveau, B. |
Charge ordering-disordering in Th-doped CaMnO3 |
1999 |
European physical journal : B : condensed matter and complex systems |
10 |
6 |
UA library record; WoS full record; WoS citing articles |
Nikolaev, A.V.; Prassides, K.; Michel, K.H. |
Charge transfer and polymer phases in AC60 (A=K, Rb, Cs) fullerides |
1998 |
The journal of chemical physics |
108 |
14 |
UA library record; WoS full record; WoS citing articles |
Riva, C.; Escorcia, R.A.; Govorov, A.O.; Peeters, F.M. |
Charged donors in quantum dots: finite difference and fractional dimensions results |
2004 |
Physical review : B : condensed matter and materials physics |
69 |
23 |
UA library record; WoS full record; WoS citing articles |
Koenraad, P.M.; Shi, J.M.; van de Stadt, A.F.W.; Smets, A.; Perenboom, J.A.A.J.; Peeters, F.M.; Devreese, J.T.; Wolter, J.H. |
Charged-impurity correlations in a δ-doped quantum barrier |
1996 |
|
|
|
UA library record |
Shi, J.M.; Koenraad, P.M.; van de Stadt, A.F.W.; Peeters, F.M.; Devreese, J.T.; Wolter, J.H. |
Charged-impurity correlations in Si ?-doped GaAs |
1996 |
|
|
|
UA library record |
De Gryse, O.; Clauws, P.; Vanhellemont, J.; Lebedev, O.; van Landuyt, J.; Simoen, E.; Claeys, C. |
Chemical and structural characterization of oxide precipitates in heavily boron doped silicon by infrared spectroscopy and transmission electron microscopy |
2002 |
|
|
|
UA library record; WoS full record; |
de Gryse, O.; Clauws, P.; Lebedev, O.; van Landuyt, J.; Vanhellemont, J.; Claeys, C.; Simoen, E. |
Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM |
2001 |
Physica: B : condensed matter
T2 – 21st International Conference on Defects in Semiconductors, JUL 16-20, 2001, GIESSEN, GERMANY |
308 |
3 |
UA library record; WoS full record; WoS citing articles |
Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
The chemical characterization of silver halide microcrystals |
1993 |
|
|
|
UA library record |
Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. |
Chemical surface characterization of complex AgX microcrystals by imaging TOF-SIMS and dual beam depth profiling |
2000 |
|
|
|
UA library record |
Partoens, B.; Peeters, F.M. |
Classical artificial two-dimensional atoms: the Thomson model |
1997 |
Journal of physics : condensed matter |
9 |
52 |
UA library record; WoS full record; WoS citing articles |
Partoens, B.; Schweigert, V.A.; Peeters, F.M. |
Classical double-layer atoms: artificial molecules |
1997 |
Physical review letters |
79 |
49 |
UA library record; WoS full record; WoS citing articles |
Peeters, F.M.; Partoens, B.; Kong, M. |
The classical electron gas in artificial structures |
2004 |
|
|
|
UA library record |
Peeters, F.M.; Partoens, B.; Schweigert, V.A.; Goldoni, G. |
Classical molecules in two dimensions |
1997 |
Physica: E |
1 |
5 |
UA library record; WoS full record; WoS citing articles |