Number of records found: 7465
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An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic images”. Croitoru MD, van Dyck D, Van Aert S, Bals S, Verbeeck J, Ultramicroscopy 106, 933 (2006). http://doi.org/10.1016/j.ultramic.2006.04.006
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Electron inelastic, scattering and anisotropy: the two-dimensional point of view”. Radtke G, Botton GA, Verbeeck J, Ultramicroscopy 106, 1082 (2006). http://doi.org/10.1016/j.ultramic.2006.04.023
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Experiments on inelastic electron holography”. Potapov P, Lichte H, Verbeeck J, van Dyck D, Ultramicroscopy 106, 1012 (2006). http://doi.org/10.1016/j.ultramic.2006.05.012
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Interpretation of “Energy-filtered electron-diffracted beam holography&rdquo, by R.A. Herring”. Verbeeck J, Ultramicroscopy 106, 461 (2006). http://doi.org/10.1016/j.ultramic.2005.12.004
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Model-based quantification of EELS spectra: including the fine structure”. Verbeeck J, Van Aert S, Bertoni G, Ultramicroscopy 106, 976 (2006). http://doi.org/10.1016/j.ultramic.2006.05.006
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Quantification of crystalline and amorphous content in porous TiO2 samples from electron energy loss spectroscopy”. Bertoni G, Beyers E, Verbeeck J, Mertens M, Cool P, Vansant EF, Van Tendeloo G, Ultramicroscopy 106, 630 (2006). http://doi.org/10.1016/j.ultramic.2006.03.006
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EDXRF determination of impurities in potassium dihydrogenphosphate single crystals and raw materials”. Belikov KN, Mikhailova LI, Spolnik ZM, Van Grieken R, X-ray spectrometry 35, 112 (2006). http://doi.org/10.1002/XRS.874
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High-energy polarized-beam EDXRF for trace metal analysis of vegetation samples in environmental studies”. Marguí, E, Padilla R, Hidalgo M, Queralt I, Van Grieken R, X-ray spectrometry 35, 169 (2006). http://doi.org/10.1002/XRS.890
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New Chinese members of the Advisory Board of X-Ray Spectrometry”. Van Grieken R, X-ray spectrometry 35, 205 (2006)
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Speciation of selected metals in aerosol samples by TXRF after sequential leaching”. Samek L, Ostachowicz B, Worobiec A, Spolnik Z, Van Grieken R, X-ray spectrometry 35, 226 (2006). http://doi.org/10.1002/XRS.905
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Ge40.0Te5.3I8: synthesis, crystal structure, and properties of a new clathrate-I compound”. Kovnir KA, Abramchuk NS, Zaikina JV, Baitinger M, Burkhardt U, Schnelle W, Olenev AV, Lebedev OI, Van Tendeloo G, Dikarev EV, Shevelkov AV, Zeitschrift für Kristallographie 221, 527 (2006). http://doi.org/10.1524/zkri.2006.221.5-7.527
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Ab initio computation of the mean inner Coulomb potential of technological important semiconductors”. Schowalter M, Rosenauer A, Lamoen D, Kruse P, Gerthsen D, 1007, 233 (2005)
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First-principles calculations of 002 structure factors for electron scattering in strained InxGa1-xAs”. Rosenauer A, Schowalter M, Glas F, Lamoen D, 107, 151 (2005)
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Stability of vortex-antivortex “molecules&rdquo, in mesoscopic superconducting triangles”. Misko VR, Fomin VM, Devreese JT, Moshchalkov VV, 3rd International Symposium on Mesoscopic Superconductivity and, Spintronics, MAR 01-04, 2004, Atsug, 191 (2005). http://doi.org/10.1142/9789812701619_0030
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Transmission electron microscopy and structural phase transitions in anion-deficient perovskite-based oxides”. Hadermann J, Van Tendeloo G, Abakumov AM, Acta crystallographica: section A: foundations of crystallography 61, 77 (2005). http://doi.org/10.1107/S0108767304023013
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Quantitative determination of strain fields around Ni4Ti3 precipitates in NiTi”. Tirry W, Schryvers D, Acta materialia 53, 1041 (2005). http://doi.org/10.1016/j.actamat.2004.10.049
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Classical nature of quantum dots in a magnetic field”. Anisimovas E, Matulis A, Peeters FM, Acta physica Polonica: A: general physics, solid state physics, applied physics 107, 188 (2005)
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Mercator maps of orientations of a C60 molecule in single-walled nanotubes with distinct radii”. Michel KH, Verberck B, Nikolaev A, AIP conference proceedings 786, 69 (2005)
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Reentrant melting of a classical two-dimensional binary cluster”. Nelissen K, Heytens L, Schweigert VA, Peeters FM, AIP conference proceedings 799, 347 (2005)
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Microanalytical characterization of surface decoration in Majolica pottery”. Padilla R, Schalm O, Janssens K, Arrazcaeta R, van Espen P, Analytica chimica acta 535, 201 (2005). http://doi.org/10.1016/J.ACA.2004.11.082
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Quantitative determination of low-Z elements in single atmospheric particles on boron substrates by automated scanning electron microscopy: energy-dispersive X-ray spectrometry”. Choël M, Deboudt K, Osán J, Flament P, Van Grieken R, Analytical chemistry 77, 5686 (2005). http://doi.org/10.1021/AC050739X
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Interpretation of TOF-SIMS depth profiles from ultrashallow high-k dielectric stacks assisted by hybrid collisional computer simulation”. Ignatova VA, Möller W, Conard T, Vandervorst W, Gijbels R, Applied physics A : materials science &, processing 81, 71 (2005). http://doi.org/10.1007/s00339-005-3239-8
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Ab initio computation of the mean inner Coulomb potential of amorphous carbon structures”. Schowalter M, Titantah JT, Lamoen D, Kruse P, Applied physics letters 86, 112102 (2005). http://doi.org/10.1063/1.1885171
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Critical size for exchange bias in ferromagnetic-antiferromagnetic particles”. Dobrynin AN, Ievlev DN, Temst K, Lievens P, Margueritat J, Gonzalo J, Afonso CN, Zhou SQ, Vantomme A, Piscopiello E, Van Tendeloo G, Applied physics letters 87, 012501 (2005). http://doi.org/10.1063/1.1978977
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Measurement of the mean inner potential of ZnO nanorods by transmission electron holography”. Müller E, Kruse P, Gerthsen D, Schowalter M, Rosenauer A, Lamoen D, Kling R, Waag A, Applied Physics Letters 86 (2005). http://doi.org/10.1063/1.1901820
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The role of Al on Ohmic contact formation on n-type GaN and AlGaN/GaN”. van Daele B, Van Tendeloo G, Ruythooren W, Derluyn J, Leys M, Germain M, Applied physics letters 87, 061905 (2005). http://doi.org/10.1063/1.2008361
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Spin-polarized transport of two-dimensional electron gas embedded in a diluted magnetic semiconductor”. Yang W, Chang K, Peeters FM, Applied physics letters 86, 192107 (2005). http://doi.org/10.1063/1.1927693
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Strain relaxation and oxygen superstructure modulation in epitaxial Sr4Fe6O13\pm\delta films”. Santiso J, Pardo JA, Solis C, Garcia G, Figueras A, Rossell MD, Van Tendeloo G, Applied physics letters 86, 132105 (2005). http://doi.org/10.1063/1.1886264
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Transmission electron microscopy and electron energy-loss spectroscopy analysis of manganese oxide nanowires”. Du GH, Yuan ZY, Van Tendeloo G, Applied physics letters 86 (2005). http://doi.org/10.1063/1.1861963
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Optimization of measurement conditions of an energy dispersive X-ray fluorescence spectrometer with high-energy polarized beam excitation for analysis of aerosol filters”. Spolnik Z, Belikov K, van Meel K, Adriaenssens E, de Roeck F, Van Grieken R, Applied spectroscopy 59, 1465 (2005). http://doi.org/10.1366/000370205775142647
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