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Chemical composition, mass size distribution and source analysis of long-range transported wildfire smokes in Helsinki”. Sillanpää, M, Saarikoski S, Hillamo R, Pennanen A, Makkonen U, Spolnik Z, Van Grieken R, Koskentalo T, Salonen RO, The science of the total environment 350, 119 (2005). http://doi.org/10.1016/J.SCITOTENV.2005.01.024
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Sources and elemental composition of ambient PM2.5 in three European cities”. Vallius M, Janssen NAH, Heinrich J, Hoek G, Ruuskanen J, Cyrys J, Van Grieken R, de Hartog JJ, Kreyling WG, Pekkanen J, The science of the total environment 337, 147 (2005). http://doi.org/10.1016/J.SCITOTENV.2004.06.018
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Ruthenium staining as an alternative preparation method for automated EPMA of individual biogenic and organic particles”. Worobiec A, Kaplinski A, Van Grieken R, X-ray spectrometry 34, 245 (2005). http://doi.org/10.1002/XRS.807
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The classical electron gas in artificial structures”. Peeters FM, Partoens B, Kong M, , 235 (2004)
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Ionization density in hydrocarbon flames: numerical modelling”. Migoun A, Cenian A, Chernukho A, Bogaerts A, Gijbels R, Leys C, , 130 (2004)
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Langmuir probe diagnostic of high pressure plasmas: study by PIC-MC modelling”. Cenian A, Chernukho A, Bogaerts A, Gijbels R, Leys C, , 61 (2004)
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Modelling of formation and transport of nanoparticles in silane discharges”. de Bleecker K, Bogaerts A, Goedheer WJ, Gijbels R, , 0 (2004)
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Parametric study by means of numerical modelling for a dielectric barrier discharge at atmospheric pressure in nitrogen”. Madani M, Bogaerts A, Gijbels R, Vangeneugden D, , 49 (2004)
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An interactive curvature based rigid-body image registartion technique: an application of EFTEM”. Leemans A, Sijbers J, van den Broek W, Yang Z, (2004)
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Introduction and overview”. Janssens K, Van Grieken R page 1 (2004).
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Kempenaers L, Vincze L, Vekemans B, Janssens K, Adams F, Somogyi A, Drakopoulos M, Simionovici AS (2004) Micro-heterogeneity study of trace elements in reference materials. 132 p
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Monte Carlo simulation for X-ray fluorescence spectroscopy”. Vincze L, Janssens K, Vekemans B, Adams F page 435 (2004).
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Non-destructive micoranalysis of cultural heritage materials”. Janssens K, Van Grieken R page 800 p. (2004).
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Polycapillary X-ray optics”. Gao N, Janssens K page 89 (2004).
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Preface”. Janssens K, Van Grieken R page xxvii-xxviii (2004).
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Provenance analysis of glass artefacts”. Gratuze B, Janssens K page 663 (2004).
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X-ray based methods of analysis”. Janssens K page 129 (2004).
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Damages caused to European monuments by air pollution: assessment and preventive measures”. Saiz-Jimenez C, Brimblecombe P, Camuffo D, Lefèvre R-A, Van Grieken R page 91 (2004).
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Effects of air pollution and microclimate on stained glass windows: prliminary results in the Sainte Chapelle (Paris)”. Bernardi A, Becherini F, Kontozova V, Godoi RHM, Van Grieken R, Deutsch F page 133 (2004).
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Introduction: considering the role of X-ray spectrometry in chemical analysis and outlining the volume”. Van Grieken R page 1 (2004).
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Investigation of individual particles and gaseous air pollutants in showcases”. Godoi RHM, Kontozova V, Godoi AFL, Van Grieken R page 147 (2004).
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Speciation and surface analysis of single particles using electron-excited X-ray emission spectrometry”. Szalóki I, Ro C-U, Osán J, de Hoog J, Van Grieken R page 569 (2004).
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Synchrotron computed X-ray fluorescence tomography in environmental and earth sciences: radiation”. Vincze L, Vekemans B, Adams F, (2004)
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Synchrotron radiation for microscopic X-ray fluorescence analysis”. Adams F, Vincze L, Vekemans B page 343 (2004).
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X-ray fluorescence microtomography and polycapillary based confocal imaging using synchrotron radiation”. Vincze L, Vekemans B, Szaloki I, Brenker FE, Falkenberg G, Rickers K, Aerts K, Van Grieken R, Adams F, , 220 (2004). http://doi.org/10.1117/12.560416
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X-ray spectrometry for air pollution and cultural heritage research”. Van Grieken R, Delalieux F, (2004)
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Tsuji K, Injuk J, Van Grieken R (2004) X-ray spectrometry: recent technological advances. 616 p
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An expert system for chemical speciation of individual particles using low-Z particle electron probe X-ray microanalysis data”. Ro C-U, Kim HK, Van Grieken R, Analytical chemistry 76, 1322 (2004). http://doi.org/10.1021/AC035149I
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Three-dimensional trace element analysis by confocal X-ray microfluorescence imaging”. Vincze L, Vekemans B, Brenker FE, Falkenberg G, Rickers K, Somogyi A, Kersten M, Adams F, Analytical chemistry 76, 6786 (2004). http://doi.org/10.1021/AC049274L
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X-ray spectrometry”. Szalóki I, Osán J, Van Grieken RE, Analytical chemistry 76, 3445 (2004). http://doi.org/10.1021/AC0400820
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