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	“Redeposition and differential sputtering of La in transmission electron microscopy samples of LaAIO₃/SrTiO₃ multilayers prepared by focused ion beam”. Montoya E, Bals S, Van Tendeloo G, Journal of microscopy 231, 359 (2008). http://doi.org/10.1111/j.1365-2818.2008.02055.x Keywords: A1 Journal article; Electron microscopy for materials research (EMAT) Impact Factor: 1.692 DOI: 10.1111/j.1365-2818.2008.02055.x Additional Links: UA library record; WoS full record Permanent link \| Save citation: RTF PDF LaTeX \| Export record: BibTeX Endnote ISI RIS Word XML

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