toggle visibility
Search within Results:
Display Options:

Select All    Deselect All
 |   | 
Details
   print
  Record Links
Author Montoya, E.; Bals, S.; Van Tendeloo, G. pdf  doi
openurl 
  Title Redeposition and differential sputtering of La in transmission electron microscopy samples of LaAIO3/SrTiO3 multilayers prepared by focused ion beam Type A1 Journal article
  Year (down) 2008 Publication Journal of microscopy Abbreviated Journal J Microsc-Oxford  
  Volume 231 Issue 3 Pages 359-363  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT)  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Oxford Editor  
  Language Wos 000259611000001 Publication Date 2008-08-28  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0022-2720;1365-2818; ISBN Additional Links UA library record; WoS full record  
  Impact Factor 1.692 Times cited Open Access  
  Notes The authors are grateful to M. Huijben and G. Rijnders of the MESA+ group at the University of Twente (NI) for the growth of the multilayers. This work has been performed under the Interuniversity Attraction Poles programme – Belgian State Belgian Science Policy. The authors acknowledge financial support from the European Union under the framework 6 program under a contract for an Integrated Infrastructure initiative. Part of this work was performed with financial support from the European Union under the framework 6 programme, under a contract for an Integrated Infrastructure Initiative (Reference No. 02601.9 ESTEEM). Approved Most recent IF: 1.692; 2008 IF: 1.409  
  Call Number UA @ lucian @ c:irua:76522 Serial 2849  
Permanent link to this record
Select All    Deselect All
 |   | 
Details
   print

Save Citations:
Export Records: