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Author Title Year (down) Publication Volume Times cited Additional Links
van Daele, B.; Van Tendeloo, G.; Ruythooren, W.; Derluyn, J.; Leys, M.R.; Germain, M. Transmission electron microscopy characterisation of Ti and Al/Ti contacts on GaN and AlGaN/GaN 2005 Springer proceedings in physics 107 UA library record; WoS full record;