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Advanced TEM and SEM methods applied to 3D nano- and microstructural investigations of Ni4Ti3 precipitates in Ni-Ti (SMA)”. Schryvers D, Tirry W, Cao S, Diffusion and defect data : solid state data : part B : solid state phenomena 172/174, 229 (2011). http://doi.org/10.4028/www.scientific.net/SSP.172-174.229
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