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“
Imaging time-of-flight SIMS (TOF-SIMS) surface analysis of halide distributions in complex silver halide microcrystals
”. Verlinden G, Gijbels R, Geuens I, Benninghoven A, , 871 (1998)
Keywords:
P3 Proceeding; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
Additional Links:
UA library record
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