Number of records found: 2
 | 
Citations
 | 
   web
Transmission electron microscopy study of microstructural evolution in nanograined Ni-Ti microwires heat treated by electric pulse”. Delville R, Malard B, Pilch J, Sittner P, Schryvers D, Diffusion and defect data : solid state data : part B : solid state phenomena 172/174, 682 (2011). http://doi.org/10.4028/www.scientific.net/SSP.172-174.682
toggle visibility
Transmission electron microscopy investigation of dislocation slip during superelastic cycling of NiTi wires”. Delville R, Malard B, Pilch J, Sittner P, Schryvers D, International journal of plasticity 27, 282 (2011). http://doi.org/10.1016/j.ijplas.2010.05.005
toggle visibility