NANOlab Center of Excellence literature database -- Query Results

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Citations

“Comparative material characterization of historical and industrial samples by using a compact micro-XRF spectrometer”. Bichlmeier S, Janssens K, Heckel J, Hoffmann P, Ortner HM, X-ray spectrometry 31, 87 (2002). http://doi.org/10.1002/XRS.563 Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) Impact Factor: 1.298 Times cited: 12 DOI: 10.1002/XRS.563 Additional Links: UA library record; WoS full record; WoS citing articles show.php?record=5529