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“
TEM annular objective apertures fabricated by FIB
”. Bals S, Radmilovic V, Kisielowski C, Microscopy and microanalysis
10
, 1148 (2004). http://doi.org/10.1017/S1431927604881765
Keywords:
A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor:
1.891
DOI:
10.1017/S1431927604881765
Additional Links:
UA library record
show.php?record=3475
