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| Author | Van Aert, S.; Bals, S.; Chang, L.Y.; den Dekker, A.J.; Kirkland, A.I.; Van Dyck, D.; Van Tendeloo, G. | ||||
| Title | The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data | Type | H1 Book chapter | ||
Year  |
2008 | Publication | Abbreviated Journal | ||
| Volume | Issue | Pages | 97-98 | ||
| Keywords | H1 Book chapter; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Springer | Place of Publication | Berlin | Editor | |
| Language | Wos | Publication Date | 2009-03-17 | ||
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | ISBN | 978-3-540-85154-7 | Additional Links | UA library record | |
| Impact Factor | Times cited | Open Access | |||
| Notes | Approved | Most recent IF: NA | |||
| Call Number | UA @ lucian @ c:irua:136865 | Serial | 4493 | ||
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