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| Record | |||||
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| Author | Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. | ||||
| Title | Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS) | Type | H3 Book chapter | ||
Year  |
1998 | Publication | Abbreviated Journal | ||
| Volume | Issue | Pages | 528-532 | ||
| Keywords | H3 Book chapter; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Antwerp | Editor | ||
| Language | Wos | Publication Date | 0000-00-00 | ||
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | ISBN | Additional Links | UA library record | ||
| Impact Factor | Times cited | Open Access | |||
| Notes | Approved | Most recent IF: NA | |||
| Call Number | UA @ lucian @ c:irua:24911 | Serial | 3391 | ||
| Permanent link to this record | |||||