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| Record | |||||
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| Author | Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. | ||||
| Title | Characterization of complex silver halide photographic systems by means of analytical electron microscopy | Type | A1 Journal article | ||
Year  |
1995 | Publication | Microbeam analysis | Abbreviated Journal | |
| Volume | 4 | Issue | 1 | Pages | 1-29 |
| Keywords | A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Deerfield Beach, Fla | Editor | ||
| Language | Wos | A1995RR65700001 | Publication Date | 0000-00-00 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1061-3420 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | Times cited | 9 | Open Access | ||
| Notes | Approved | PHYSICS, APPLIED 28/145 Q1 # | |||
| Call Number | UA @ lucian @ c:irua:12275 | Serial | 318 | ||
| Permanent link to this record | |||||