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| Record | |||||
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| Author | Van Aert, S. | ||||
| Title | Statistical parameter estimation theory : a tool for quantitative electron microscopy | Type | H1 Book chapter | ||
Year  |
2012 | Publication | Abbreviated Journal | ||
| Volume | Issue | Pages | 281-309 | ||
| Keywords | H1 Book chapter; Electron microscopy for materials research (EMAT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Wiley-VCH | Place of Publication | Weinheim | Editor | |
| Language | Wos | Publication Date | 0000-00-00 | ||
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | ISBN | 978-3-527-31706-6 | Additional Links | UA library record | |
| Impact Factor | Times cited | Open Access | |||
| Notes | Approved | Most recent IF: NA | |||
| Call Number | UA @ lucian @ c:irua:96693 | Serial | 3159 | ||
| Permanent link to this record | |||||