| Home | << 1 >> |
|
| Record | |||||
|---|---|---|---|---|---|
| Author | Bals, S.; Kilaas, R.; Kisielowski, C. | ||||
| Title | Nonlinear imaging using annular dark field TEM | Type | A1 Journal article | ||
Year  |
2005 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume | 104 | Issue | 3/4 | Pages | 281-289 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | Annular dark field TEM images exhibit a dominant mass-thickness contrast that can be quantified to extract single atom scattering cross sections. On top of this incoherent background, additional lattice fringes appear with a nonlinear information limit of 1.2 angstrom at 150 kV. The formation of these fringes is described by coherent nonlinear imaging theory and good agreement is found between experimental and simulated images. Calculations furthermore predict that the use of aberration corrected microscopes will improve the image quality dramatically. (c) 2005 Elsevier B.V. All rights reserved. | ||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000231297100012 | Publication Date | 2005-06-16 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.843 | Times cited | 15 | Open Access | |
| Notes | Approved | Most recent IF: 2.843; 2005 IF: 2.490 | |||
| Call Number | UA @ lucian @ c:irua:64685 | Serial | 2352 | ||
| Permanent link to this record | |||||