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| Record | |||||
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| Author | Lebedev, O.I.; Van Tendeloo, G.; Suvorova, A.A.; Usov, I.O.; Suvorov, A.V. | ||||
| Title | HREM study of ion implantation in 6H-SiC at high temperatures | Type | A1 Journal article | ||
Year  |
1997 | Publication | Journal of electron microscopy | Abbreviated Journal | Microscopy-Jpn |
| Volume | 46 | Issue | 4 | Pages | 271-279 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Tokyo | Editor | ||
| Language | Wos | A1997XY94900002 | Publication Date | 0000-00-00 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0022-0744; 1477-9986 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 0.9 | Times cited | 7 | Open Access | |
| Notes | Approved | Most recent IF: NA | |||
| Call Number | UA @ lucian @ c:irua:21444 | Serial | 1511 | ||
| Permanent link to this record | |||||