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| Author | Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Verbeeck, A.; de Keyzer, R. | ||||
| Title | Characterization of crystal defects in mixed tabular silver halide grains by conventional transmission electron microscopy and X-ray diffractometry | Type | A1 Journal article | ||
Year  |
1991 | Publication | Journal of crystal growth | Abbreviated Journal | J Cryst Growth |
| Volume | 110 | Issue | Pages | 930-941 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | A1991FL02100033 | Publication Date | 0000-00-00 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0022-0248 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 1.698 | Times cited | 40 | Open Access | |
| Notes | Approved | ||||
| Call Number | UA @ lucian @ c:irua:48349 | Serial | 321 | ||
| Permanent link to this record | |||||