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| Record | |||||
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| Author | Geuens, P.; Lebedev, O.I.; van Dyck, D.; Van Tendeloo, G. | ||||
| Title | Accurate measurements of atomic displacements in La0.9Sr0.1MnO3 thin films grown on a SrTiO3 substrate | Type | H3 Book chapter | ||
Year  |
2000 | Publication | Abbreviated Journal | ||
| Volume | Issue | Pages | 1133-1134 | ||
| Keywords | H3 Book chapter; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | s.l. | Editor | ||
| Language | Wos | Publication Date | 0000-00-00 | ||
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | ISBN | Additional Links | UA library record | ||
| Impact Factor | Times cited | Open Access | |||
| Notes | Approved | Most recent IF: NA | |||
| Call Number | UA @ lucian @ c:irua:54730 | Serial | 49 | ||
| Permanent link to this record | |||||