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Author
Frangis, N.
;
van Landuyt, J.
;
Lartiprete, R.
;
Martelli, S.
;
Borsella, E.
;
Chiussi, S.
;
Castro, J.
;
Leon, B.
Title
High resolution electron microscopy and X-ray photoelectron spectroscopy studies of heteroepitaxial Si
x
Ge
1-x
alloys produced through laser induced processing
Type
A1 Journal article
Year
1998
Publication
Applied physics letters
Abbreviated Journal
Appl Phys Lett
Volume
72
Issue
22
Pages
2877-2879
Keywords
A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract
Address
Corporate Author
Thesis
Publisher
American Institute of Physics
Place of Publication
New York, N.Y.
Editor
Language
Wos
000075273700034
Publication Date
2002-07-26
Series Editor
Series Title
Abbreviated Series Title
Series Volume
Series Issue
Edition
ISSN
0003-6951;
ISBN
Additional Links
UA library record
;
WoS full record
;
WoS citing articles
Impact Factor
3.411
Times cited
16
Open Access
Notes
Approved
Most recent IF: 3.411; 1998 IF: 3.349
Call Number
UA @ lucian @ c:irua:29684
Serial
1447
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