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Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
Characterization of crystal defects and analysis of iodide distribution in mixed tabular silver halide grains by conventional transmission electron microscopy, X-ray diffractometry and back-scattered electron imaging |
1991 |
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|
|
UA library record |
|
|
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Geuens, I.; Nys, B.; Naudts, J.; Gijbels, R.; Jacob, W.; van Espen, P. |
The primary energy dependence of backscattered electron images up to 100 keV |
1991 |
Scanning microscopy |
5 |
3 |
UA library record; WoS full record; WoS citing articles |
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|
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Geuens, I.; Gijbels, R.; Jacob, W. |
Depth profiling of silver halide microcrystals |
1991 |
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|
UA library record |
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