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Author Title Year (down) Publication Volume Times cited Additional Links
Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. Characterization of crystal defects and analysis of iodide distribution in mixed tabular silver halide grains by conventional transmission electron microscopy, X-ray diffractometry and back-scattered electron imaging 1991 UA library record
Geuens, I.; Nys, B.; Naudts, J.; Gijbels, R.; Jacob, W.; van Espen, P. The primary energy dependence of backscattered electron images up to 100 keV 1991 Scanning microscopy 5 3 UA library record; WoS full record; WoS citing articles
Geuens, I.; Gijbels, R.; Jacob, W. Depth profiling of silver halide microcrystals 1991 UA library record