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Author van Dyck, D.; Van Aert, S.; den Dekker, A.J.; van den Bos, A.
  Title Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures? Type A1 Journal article
  Year (down) 2003 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy
  Volume 98 Issue Pages 27-42
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
  Abstract
  Address
  Corporate Author Thesis
  Publisher Place of Publication Amsterdam Editor
  Language Wos 000186831500003 Publication Date 2003-04-25
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles
  Impact Factor 2.843 Times cited 26 Open Access
  Notes Approved Most recent IF: 2.843; 2003 IF: 1.665
  Call Number UA @ lucian @ c:irua:47516 Serial 1749
Permanent link to this record
 
 
Author Rosenauer, A.; Gerthsen, D.; Van Aert, S.; van Dyck, D.; den Dekker, A.J.
  Title Present state of the composition evaluation of ternary semiconductor nanostructures by lattice fringe analysis Type A1 Journal article
  Year (down) 2003 Publication Institute of physics conference series Abbreviated Journal
  Volume Issue 180 Pages 19-22
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
  Abstract Semiconductor heterostructures are used for the fabrication of optoelectronic devices. Performance of such devices is governed by their chemical morphology. The composition distribution of quantum wells and dots is influenced by kinetic growth processes which are not understood completely at present. To obtain more information about these effects, methods for composition determination with a spatial resolution at a near atomic scale are necessary. In this paper we focus on the present state of the composition evaluation by the lattice fringe analysis (CELFA) technique and explain the basic ideas, optimum imaging conditions, precision and accuracy.
  Address
  Corporate Author Thesis
  Publisher Place of Publication Editor
  Language Wos Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN 0-7503-0979-2 ISBN Additional Links UA library record; WoS full record;
  Impact Factor Times cited Open Access
  Notes Approved Most recent IF: NA
  Call Number UA @ lucian @ c:irua:95118 Serial 2710
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Author Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.
  Title High-resolution electron microscopy : from imaging toward measuring Type A1 Journal article
  Year (down) 2002 Publication IEEE transactions on instrumentation and measurement Abbreviated Journal Ieee T Instrum Meas
  Volume 51 Issue 4 Pages 611-615
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
  Abstract
  Address
  Corporate Author Thesis
  Publisher Place of Publication New York, N.Y. Editor
  Language Wos 000178992000010 Publication Date 2003-01-03
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN 0018-9456; ISBN Additional Links UA library record; WoS full record; WoS citing articles
  Impact Factor 2.456 Times cited 13 Open Access
  Notes Approved Most recent IF: 2.456; 2002 IF: 0.592
  Call Number UA @ lucian @ c:irua:47521 Serial 1450
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Author Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A.
  Title High-resolution electron microscopy and electron tomography: resolution versus precision Type A1 Journal article
  Year (down) 2002 Publication Journal of structural biology Abbreviated Journal J Struct Biol
  Volume 138 Issue Pages 21-33
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
  Abstract
  Address
  Corporate Author Thesis
  Publisher Place of Publication New York Editor
  Language Wos 000177978800003 Publication Date 2002-09-17
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN 1047-8477; ISBN Additional Links UA library record; WoS full record; WoS citing articles
  Impact Factor 2.767 Times cited 33 Open Access
  Notes Approved Most recent IF: 2.767; 2002 IF: 4.194
  Call Number UA @ lucian @ c:irua:47520 Serial 1446
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Author Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A.
  Title Optimal experimental design of STEM measurement of atom column positions Type A1 Journal article
  Year (down) 2002 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy
  Volume 90 Issue Pages 273-289
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
  Abstract
  Address
  Corporate Author Thesis
  Publisher Place of Publication Amsterdam Editor
  Language Wos 000174770900004 Publication Date 2002-07-25
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles
  Impact Factor 2.843 Times cited 35 Open Access
  Notes Approved Most recent IF: 2.843; 2002 IF: 1.772
  Call Number UA @ lucian @ c:irua:47517 Serial 2483
Permanent link to this record
 
 
Author Van Aert, S.; van Dyck, D.
  Title Do smaller probes in a scanning transmission electron microscope result in more precise measurement of the distances between atom columns? Type A1 Journal article
  Year (down) 2001 Publication Philosophical magazine: B: physics of condensed matter: electronic, optical and magnetic properties Abbreviated Journal
  Volume 81 Issue 11 Pages 1833-1846
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
  Abstract
  Address
  Corporate Author Thesis
  Publisher Place of Publication London Editor
  Language Wos 000172199700016 Publication Date 2007-07-08
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN 1364-2812;1463-6417; ISBN Additional Links UA library record; WoS full record; WoS citing articles
  Impact Factor Times cited 11 Open Access
  Notes Approved Most recent IF: NA
  Call Number UA @ lucian @ c:irua:47519 Serial 744
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Author Van Aert, S.; den Dekker, A.J.; van den Bos, A.; Van Dyck, D.
  Title High resolution electron microscopy from imaging towards measuring Type H2 Book chapter
  Year (down) 2001 Publication ... IEEE International Instrumentation and Measurement Technology Conference T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3 Abbreviated Journal
  Volume Issue Pages 2081-2086
  Keywords H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab
  Abstract
  Address
  Corporate Author Thesis
  Publisher Ieee Place of Publication Editor
  Language Wos Publication Date 2002-11-13
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN ISBN 0-7803-6646-8 Additional Links UA library record
  Impact Factor Times cited Open Access
  Notes Approved Most recent IF: NA
  Call Number UA @ lucian @ c:irua:136870 Serial 4501
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Author den Dekker, A.J.; Van Aert, S.; van Dyck, D.; van den Bos, A.; Geuens, P.
  Title Does a monochromator improve the precision in quantitative HRTEM? Type A1 Journal article
  Year (down) 2001 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy
  Volume 89 Issue Pages 275-290
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
  Abstract
  Address
  Corporate Author Thesis
  Publisher Place of Publication Amsterdam Editor
  Language Wos 000172667000004 Publication Date 2002-07-25
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles
  Impact Factor 2.843 Times cited 22 Open Access
  Notes Approved Most recent IF: 2.843; 2001 IF: 1.890
  Call Number UA @ lucian @ c:irua:47518 Serial 746
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