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“Structure and microstructure of epitaxial SrnFenO3n-1 films”. Lebedev OI, Verbeeck J, Van Tendeloo G, Hayashi N, Terashima T, Takano M, Philosophical magazine 84, 3825 (2004). http://doi.org/10.1080/14786430412331313187
Abstract: Thin films of SrFeO3-x (0 less than or equal to x less than or equal to 0.5) (SFO) grown on a (LaAlO3)(0.3) (SrAl0.5Ta0.5O3)(0.7) (LSAT) substrate by Pulsed laser deposition have been structurally investigated by electron diffraction and high resolution transmission electron microscopy for different post-deposition oxygen treatments. During the deposition and post-growth oxidation, the oxygen-reduced SFO films accept extra oxygen along the tetrahedral layers to minimize the elastic strain energy. The oxidation process stops at a concentration SFO2.875 and/or SFO2.75 because a zero misfit with the LSAT substrate is reached. A possible growth mechanism and phase transition mechanism are suggested. The non-oxidized films exhibit twin boundaries having a local perovskite-type structure with a nominal composition close to SFO3.
Keywords: A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT)
Impact Factor: 1.505
Times cited: 4
DOI: 10.1080/14786430412331313187
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“Antiferroelectric phase transition in Sr9In(PO4)7”. Stefanovich SY, Belik AA, Azuma M, Takano M, Baryshnikova OV, Morozov VA, Lazoryak BI, Lebedev OI, Van Tendeloo G, Physical review : B : condensed matter and materials physics 70, 172103 (2004). http://doi.org/10.1103/PhysRevB.70.172103
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 3.836
Times cited: 17
DOI: 10.1103/PhysRevB.70.172103
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“Structure of epitaxial Ca2Fe2O5 films deposited on different perovskite-type substrates”. Rossell MD, Lebedev OI, Van Tendeloo G, Hayashi N, Terashima T, Takano M, Journal of applied physics 95, 5145 (2004). http://doi.org/10.1063/1.1689003
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.068
Times cited: 16
DOI: 10.1063/1.1689003
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