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Author |
van der Snickt, G.; Martins, A.; Delaney, J.; Janssens, K.; Zeibel, J.; Duffy, M.; McGlinchey, C.; Van Driel, B.; Dik, J. |
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Title |
Exploring a hidden painting below the surface of Rene Magritte's Le Portrait |
Type |
A1 Journal article |
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Year  |
2016 |
Publication |
Applied spectroscopy |
Abbreviated Journal |
Appl Spectrosc |
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Volume |
70 |
Issue |
1 |
Pages |
57-67 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
Two state-of-the-art methods for non-invasive visualization of subsurface (or overpainted) pictorial layers present in painted works of art are employed to study Le portrait, painted by Belgian artist Rene Magritte in 1935. X-ray radiography, a commonly used method for the nondestructive inspection of paintings, had revealed the presence of an underlying figurative composition, part of an earlier Magritte painting entitled La pose enchantee (1927) which originally depicted two full length nude female figures with exaggerated facial features. On the one hand, macroscopic X-ray fluorescence analysis (MA-XRF), a method capable of providing information on the distribution of the key chemical elements present in many artists' pigments, was employed. The ability of the X-rays to penetrate the upper layer of paint enabled the imaging of the facial features of the female figure and provided information on Magritte's palette for both surface and hidden composition. On the other hand, visible and near infrared hyperspectral imaging spectroscopies in transmission mode were also used, especially in the area of the table cloth in order to look through the upper representation and reveal the pictorial layer(s) below. MA-XRF provided elemental information on the pigment distributions in both the final painting and the prior whereas the transmission mode provided information related to preparatory sketches as well as revealing differences between the paints used in both compositions. These results illustrate very well the manner in which the two imaging methods complement each other, both in the sense of providing different types of information on the nature and presence of paint components/pigments and in the sense of being optimally suited to easily penetrate through different types of overpaint. |
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Wos |
000368604500007 |
Publication Date |
2016-01-27 |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0003-7028 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
1.529 |
Times cited |
13 |
Open Access |
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Notes |
; GvdS and KJ acknowledge the support of the Fund Inbev-Baillet Latour. JKD acknowledges support from the Andrew Mellon Foundation and the National Science Foundation. BvD and JD acknowledge support from The Netherlands Organisation for Scientific Research (NWO). ; |
Approved |
Most recent IF: 1.529 |
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Call Number |
UA @ admin @ c:irua:131544 |
Serial |
5620 |
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Author |
Marguí, E.; Van Grieken, R.; Fontàs, C.; Hidalgo, M.; Queralt, I. |
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Title |
Preconcentration methods for the analysis of liquid samples by X-ray fluorescence techniques |
Type |
A1 Journal article |
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Year |
2010 |
Publication |
Applied spectroscopy reviews |
Abbreviated Journal |
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Volume |
45 |
Issue |
3 |
Pages |
179-205 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
This article gives an overview of the state-of-the-art of multi-element and single-element preconcentration procedures prior to X-ray fluorescence (XRF) analysis of liquid samples. Many of these preconcentration methods were developed long ago and the purpose of this review is to present some new efficient variations of these methods and new techniques extending the possibilities of XRF for liquid solutions analysis. In addition, trends and future perspectives in this domain are also commented on and discussed in the last section of the review. |
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Wos |
000277705800002 |
Publication Date |
2010-01-28 |
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Edition |
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ISSN |
0066-5541 |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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no |
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Call Number |
UA @ admin @ c:irua:82557 |
Serial |
8400 |
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Author |
Potgieter-Vermaak, S.S.; Van Grieken, R. |
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Title |
Preliminary evaluation of micro-Raman spectrometry for the characterization of individual aerosol particles |
Type |
A1 Journal article |
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Year |
2006 |
Publication |
Applied spectroscopy |
Abbreviated Journal |
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Volume |
60 |
Issue |
1 |
Pages |
39-47 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Wos |
000234851900007 |
Publication Date |
2006-01-23 |
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ISSN |
0003-7028 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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no |
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Call Number |
UA @ admin @ c:irua:56074 |
Serial |
8406 |
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Author |
Spolnik, Z.; Belikov, K.; van Meel, K.; Adriaenssens, E.; de Roeck, F.; Van Grieken, R. |
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Title |
Optimization of measurement conditions of an energy dispersive X-ray fluorescence spectrometer with high-energy polarized beam excitation for analysis of aerosol filters |
Type |
A1 Journal article |
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Year |
2005 |
Publication |
Applied spectroscopy |
Abbreviated Journal |
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Volume |
59 |
Issue |
12 |
Pages |
1465-1469 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Wos |
000234187500004 |
Publication Date |
2005-12-18 |
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ISSN |
0003-7028 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Notes |
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no |
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Call Number |
UA @ admin @ c:irua:55835 |
Serial |
8339 |
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Author |
Schelles, W.; de Gendt, S.; Müller, V.; Van Grieken, R. |
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Title |
Evaluation of secondary cathodes for glow discharge mass spectrometry analysis of different nonconducting sample types |
Type |
A1 Journal article |
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Year |
1995 |
Publication |
Applied spectroscopy |
Abbreviated Journal |
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Volume |
49 |
Issue |
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Pages |
939-944 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Wos |
A1995RK40300011 |
Publication Date |
2005-05-21 |
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ISSN |
0003-7028 |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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no |
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Call Number |
UA @ admin @ c:irua:12350 |
Serial |
7941 |
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Author |
LaBrecque, J.J.; Beusen, J.M.; Van Grieken, R.E. |
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Title |
Analysis of lateritic material from Cerro impacto by instrumental neutron activation employing a low-energy photon semiconductor and a high-energy Ge(Li) detector |
Type |
A1 Journal article |
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Year |
1986 |
Publication |
Applied spectroscopy |
Abbreviated Journal |
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Volume |
40 |
Issue |
2 |
Pages |
140-144 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
Nineteen elements were determined in four different grain size fractions of a bulk geological material from Cerro Impacto for a study of the physical (mechanical) concentration process of different elements based upon the hardness of the different minerals. The analysis was performed by excitation of the sample with a high, slow neutron flux followed by gamma-ray spectroscopy with both a conventional Ge(Li) high-energy detector and a low-energy photon detector (LEPD). The accuracy of this method was studied with the use of two standard reference materials, SY-2 and SY-3, which are similar to the real samples. The values determined were also compared with a secondary target x-ray fluorescence method for all the elements that were suitable to both methods. Actually, the x-ray fluorescence method was found to be more complementary than competitive. |
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Wos |
A1986A085900003 |
Publication Date |
2005-07-21 |
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Abbreviated Series Title |
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Series Issue |
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Edition |
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ISSN |
0003-7028 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:116768 |
Serial |
7448 |
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