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Author Turner, S.; Lebedev, O.I.; Schroeder, F.; Fischer, R.A.; Van Tendeloo, G. pdf  doi
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  Title Direct imaging of loaded metal-organic framework materials (metal@MOF-5) Type A1 Journal article
  Year (down) 2008 Publication Chemistry of materials Abbreviated Journal Chem Mater  
  Volume 20 Issue 17 Pages 5622-5627  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT)  
  Abstract We illustrate the potential of advanced transmission electron microscopy for the characterization of a new class of soft porous materials: metal@Zn4O(bdc)3 (metal@MOF-5; bdc = 1,4-benzenedicarboxylate). By combining several electron microscopy techniques (transmission electron microscopy (TEM), high-resolution transmission electron microscopy (HRTEM), electron diffraction (ED), high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM), and electron tomography) and by carefully reducing the electron dose to avoid beam damage, it is possible to simultaneously characterize the MOF-5 framework material and the loaded metal nanoparticles. We also demonstrate that electron tomography can be used to accurately determine the position and distribution of the particles within the MOF-5 framework. To demonstrate the implementation of these microscopy techniques and what kind of results can be expected, measurements on gas-phase-loaded metal−organic framework materials Ru@MOF-5 and Pd@MOF-5 are presented.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Washington, D.C. Editor  
  Language Wos 000258941400021 Publication Date 2008-08-07  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0897-4756;1520-5002; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 9.466 Times cited 112 Open Access  
  Notes Esteem 026019 Approved Most recent IF: 9.466; 2008 IF: 5.046  
  Call Number UA @ lucian @ c:irua:76595 Serial 714  
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