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“Electron probe X-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level”. Hoornaert S, Treiger B, Valkovic V, Van Grieken R, Microchimica acta 128, 207 (1998). http://doi.org/10.1007/BF01243051
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“Electron probe X-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level”. Hoornaert S, Treiger B, Van Grieken R, Valkovic V page 29 (1996).
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