Kempenaers L, Vincze L, Vekemans B, Janssens K, Adams F, Somogyi A, Drakopoulos M, Simionovici AS (2004) Micro-heterogeneity study of trace elements in reference materials. 132 p
Keywords: MA3 Book as author; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Micro-heterogeneity study of trace elements in USGS, MPI-DING and glass reference materials by means of synchrotron micro-XRF”. Kempenaers L, Janssens K, Jochum KP, Vincze L, Vekemans B, Somogyi A, Drakopoulos M, Adams F, Journal of analytical atomic spectrometry 18, 350 (2003). http://doi.org/10.1039/B212196D
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor: 3.379
Times cited: 38
DOI: 10.1039/B212196D
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“Quantitative X-ray fluorescence analysis at the ESRF ID18F microprobe”. Vekemans B, Vincze L, Somogyi A, Drakopoulos M, Kempenaers L, Simionovici AS, Adams F, Nuclear instruments and methods: B 199, 396 (2003). http://doi.org/10.1016/S0168-583X(02)01396-4
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1016/S0168-583X(02)01396-4
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“A Monte Carlo model for studying the microheterogeneity of trace elements in reference materials by means of synchrotron microscopic X-ray fluorescence”. Kempenaers L, Janssens K, Vincze L, Vekemans B, Somogyi A, Drakopoulos M, Simionovici AS, Adams F, Analytical chemistry 74, 5017 (2002). http://doi.org/10.1021/AC025662G
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor: 6.32
Times cited: 21
DOI: 10.1021/AC025662G
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“Micro-heterogeneity study of trace elements in BCR CRM 680 by means of synchrotron micro-XRF”. Kempenaers L, de Koster C, van Borm W, Janssens K, Fresenius' journal of analytical chemistry 369, 733 (2001). http://doi.org/10.1007/S002160000679
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Times cited: 15
DOI: 10.1007/S002160000679
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“The use of LA-ICP-MS for the characterization of the micro-heterogeneity of heavy metals in BCR CRM 680”. Kempenaers L, Bings NH, Jeffries TE, Vekemans B, Janssens K, Journal of analytical atomic spectrometry 16, 1006 (2001). http://doi.org/10.1039/B102512K
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor: 3.379
Times cited: 23
DOI: 10.1039/B102512K
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“The use of synchrotron micro-XRF for characterisation of the micro-heterogeneity of low-Z reference materials”. Kempenaers L, Vincze L, Janssens K, Spectrochimica acta: part B : atomic spectroscopy 55, 651 (2000). http://doi.org/10.1016/S0584-8547(00)00207-X
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor: 3.241
DOI: 10.1016/S0584-8547(00)00207-X
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“The use of synchrotron micro-XRF for characterisation of the micro-heterogeneity of low-Z reference materials containing heavy metals”. Kempenaers L, Vincze L, Janssens K (1999).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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